ZEM-5

Seebeck Coefficient / Electric Resistance Measurement System ZEM-5 series

Features

A series corresponding to special specifications for the properties of various thermoelectric materials and thin films

Seebeck Coefficient/Electric Resistance Measurement Systems that can meet various needs with specifications specialized to the characteristics of materials including high-temperature materials, high-resistance materials, and thin films.

Special Features / Further Applications

Applications

  • Evaluate the thermoelectric properties of a wide variety of materials including semiconductors, ceramics, and metals

Features

  • A series corresponding to special specifications for the characteristics of various thermoelectric materials and thin films
  • A type C thermocouple is used for the temperature detection sensor, making this system optimal for evaluating Si-based thermoelectric materials (SiGe, MgSi, others) (model HT)
  • V/I plot that self-diagnoses the ohmic contact is standard
  • Measurement of high temperature up to 1200°C (model HT)
  • Measurement of high resistance of maximum 10 MΩ (model HR)
  • Measurement of materials formed as a film on substrates (model TF)
  • Measurement of low temperature from -150°C to 200°C (model LT)

A patent and a standard

Thermoelectric power JIS R 1650-1
Resistivity JIS R 1650-2

 

Specifications

Type ZEM-5HT ZEM-5HR ZEM-5LT ZEM-5TF
Measurement
Properties
Seebeck coefficient, electric resistivity
Temperature Range 100℃~1200℃ 100℃~800℃ -150℃~200℃ 50℃~500℃
Sample Size 2 to 4 mm square or φ2 to 4 mm x 3 to 15 mm length Deposited substrate: 2 to 4 mm
width x 0.4 to 1.2 mm
thickness mm x 20 mm length
Thin film thickness: nm scale or thicker
* An insulation layer is required between the sample film
and the substrate
Measurement
Atomosphere
Low-pressure He gas
Optional Cooling water circulator
Customizations for special uses can also be available
Any questions?
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